Application of Simplified FMM Algorithm in Beam Profile Measurement

The fluorescence target system is employed for the measurement of beam transverse profile in the accelerator. This paper puts forth a method whereby the fluorescence target calibration lines can be calibrated by utilizing the simplified Fast Matching Method (FMM), which can reflect the beam profile information more accurately. Initially, a simulated fluorescence target image is created in MATLAB. Thereafter, the beam profile parameters of the simulated image are compared and analyzed, both before and after the implementation of the algorithm. The simulation results demonstrate that the Structural similarity index measure (SSIM) of the processed simulated image is close to 1 and exhibits a relatively low mean square error (MSE). Finally, the fluorescence target images obtained by the Heavy Ion Medical Machine (HIMM) were employed for verification purposes, with the results demonstrating that the profile measurement outcomes are in close alignment with the evaluation value following the processing of the images gathered by HIMM. The findings of this study thus provide a foundation for the subsequent beam transverse profile parameter algorithm, facilitating acceleration of the algorithm on the Field Programmable Gate Array (FPGA).