Study on the Emission Angle of Projectile Fragment in the Interaction of 736 AMeV ²⁸Si with C Target

The angular distributions of projectile fragments produced in the interaction of ²⁸Si with C target are studied via CR-39 detectors, HSP-1000 high speed imaging microscope and PitFit track analysis software. By performing beam irradiation, chemical etching, track reconstruction and other experimental steps, the experimental results on the emission angle distribution of projectile fragments from the reaction of ²⁸Si with C target at 736 AMeV are presented for the first time, and are compared with those obtained from reactions of ²⁸Si with C target at 800 and 775 AMeV. The results show that the average value and width of the emission angle distribution of projectile fragments are greater than those of the scattering angle distribution of ²⁸Si beam particles. Most of the emission angles of projectile fragments are less than 2.0 degrees, and rarely exceed this value. The average emission angle of projectile fragments with different charge number Z falls within a range of 1.0 degree, and both the average value and width of their angular distribution generally show a decreasing trend as the fragment charge number Z increases.