Simulation of Proton Induced SEE with High Energy 12C
doi: 10.11804/NuclPhysRev.18.03.169
- Received Date: 1900-01-01
- Rev Recd Date: 1900-01-01
- Publish Date: 2001-09-20
Abstract: The mechanisms for proton and heavy ion induced single event effect (SEE) are discussed and a method to simulate proton induced SSEE (PSEE) with high energy 12 C is proposed in this paper. The experiments which can be done by using this method include single event burnout (SEB) and single event gate rupture in power MOSFET, single event upset (SEU) and single event transient (SET) in less sensitive device and angle effect. The experimets with high energy ...
Citation: | ZHANG Qing-xiang, HOU Ming-dong, ZHEN Hong-lou, LIU Jie. Simulation of Proton Induced SEE with High Energy 12C[J]. Nuclear Physics Review, 2001, 18(3): 169-173. doi: 10.11804/NuclPhysRev.18.03.169 |