Heavy Ion Induced Single Event Upset and Its Accelerator Simulation Investigation

Hou Ming-dong; Ma Feng; Liu Jie

doi:10.11804/NuclPhysRev.13.01.032

Hou Ming-dong, Ma Feng, Liu Jie. Heavy Ion Induced Single Event Upset and Its Accelerator Simulation Investigation[J]. Nuclear Physics Review, 1996, 13(1): 32-35. DOI: 10.11804/NuclPhysRev.13.01.032

Citation:

Hou Ming-dong, Ma Feng, Liu Jie. Heavy Ion Induced Single Event Upset and Its Accelerator Simulation Investigation[J]. Nuclear Physics Review, 1996, 13(1): 32-35. DOI: 10.11804/NuclPhysRev.13.01.032

Citation:

Hou Ming-dong, Ma Feng, Liu Jie. Heavy Ion Induced Single Event Upset and Its Accelerator Simulation Investigation[J]. Nuclear Physics Review, 1996, 13(1): 32-35. DOI: 10.11804/NuclPhysRev.13.01.032

Heavy Ion Induced Single Event Upset and Its Accelerator Simulation Investigation

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The harm and investigation means of single event upset in spacecraft electronics are described and a survey of simulation test by using heavy ion accelerator is also given in this paper.

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