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简化FMM算法在束流剖面测量中的应用

Application of Simplified FMM Algorithm in Beam Profile Measurement

  • 摘要: 加速器中利用荧光靶系统测量束流横向剖面,为进一步提高系统测量的准确度,本工作提出了一种利用简化快速行进算法(Fast Matching Method, FMM)填充荧光靶标定线的方法,使填充后的荧光靶图像更真实地反映束流剖面信息。首先利用Matlab生成模拟荧光靶图像,对比分析了算法处理前后的模拟图像束流剖面参数。仿真结果表明,经过处理后的模拟图像,其结构相似性(Structural Similarity Index Measure, SSIM)更接近1,均方误差(Mean Square Error, MSE)更小。最后,利用医用重离子加速器(Heavy Ion Medical Machine, HIMM)现场采集的荧光靶图像进行验证。结果表明,HIMM现场采集的图像经处理后,剖面测量结果接近评估值。本研究结果为后续束流横向剖面参数算法在可编程逻辑阵列上进行算法加速提供了依据。

     

    Abstract: The fluorescence target system is employed for the measurement of beam transverse profile in the accelerator. This paper puts forth a method whereby the fluorescence target calibration lines can be calibrated by utilizing the simplified Fast Matching Method (FMM), which can reflect the beam profile information more accurately. Initially, a simulated fluorescence target image is created in MATLAB. Thereafter, the beam profile parameters of the simulated image are compared and analyzed, both before and after the implementation of the algorithm. The simulation results demonstrate that the Structural similarity index measure (SSIM) of the processed simulated image is close to 1 and exhibits a relatively low mean square error (MSE). Finally, the fluorescence target images obtained by the Heavy Ion Medical Machine (HIMM) were employed for verification purposes, with the results demonstrating that the profile measurement outcomes are in close alignment with the evaluation value following the processing of the images gathered by HIMM. The findings of this study thus provide a foundation for the subsequent beam transverse profile parameter algorithm, facilitating acceleration of the algorithm on the Field Programmable Gate Array (FPGA).

     

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