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电导法研究PET薄膜中32S核径迹的热退火效应

Thermal Annealing Effect of 32S Ion Track in PET Film by Conductometric Etching

  • 摘要: 本工作通过测量一系列不同热处理PET薄膜的径迹蚀刻速率,研究PET薄膜中32S核径迹的热退火效应。实验使用能量为113.7 MeV的32S离子束流在低真空靶室中均匀辐照25 μm厚PET薄膜,产生垂直贯通薄膜的核径迹,对样品分别进行70~180 ºC、1~12 s热处理使核径迹发生不同程度的热退火,然后使用电导法测量核径迹蚀刻速率。实验测量结果显示,热处理时间相同时,样品的径迹蚀刻速率随热处理温度的升高而明显减小,表明核径迹热退火效应随热处理温度升高而增大;热处理温度(高于玻璃化转变温度)相同时,随热处理时间增加,样品的径迹蚀刻速率随之减小,表明核径迹热退火效应随热处理时间增加而增大。

     

    Abstract: In this work, the thermal annealing effect of nuclear track in 32S ion irradiated PET film was studied by measuring the track etch rates. PET film of 25 μm in thickness were irradiated in a vacuum chamber with 113.7 MeV 32S ions uniformly at room temperature. The heavy ions penetrated the film and the tracks were produced perpendicular to the film surface. The irradiated films were treated at temperatures ranged from 70 to 180 ºC for 1 s to 12 s by contacting with a thermostatically controlled heater. The heat treated films was chemically etched in a conductometric cell, its breakthrough times were determined from the conducting current curves, and then the track etch rates were derived. The experimental track etch rates shows the thermal annealing effect of 32S ion tracks in PET film clearly. When the heat treatment temperature is higher than the glass transition temperature of PET film, the track etching rate of treated sample is smaller than that of untreated sample. And the track etching rate of treated sample decreases obviously with the increase of heat treatment temperature. Moreover, the track etching rate of the sample decreases with the duration of the heat treatment time. So the nuclear track thermal annealing effect increases with the increase of heat treatment temperature, and it increases with the increase of the heat treatment duration also.

     

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