HIRFL-CSR实验环中束流损失机制及寿命研究

薛迎利; 蔡晓红; #; 于得洋

doi:10.11804/NuclPhysRev.25.04.355

HIRFL-CSR实验环中束流损失机制及寿命研究

Loss Mechanism and Lifetime of Ion Beam in HIRFL-CSRe

摘要

摘要: 分析了在储存环中回旋的离子束与残余气体分子、内靶和冷却电子束相互作用时的损失机制及相应的束流寿命，针对兰州重离子加速器冷却储存环实验环内靶模式，计算了50—500 MeV/u ¹²C⁶⁺, ³⁶Ar¹⁸⁺, ¹³²Xe⁵⁴⁺和 ²³⁸U⁹²⁺等束流在各种损失机制影响下所对应的束流寿命和总的束流寿命。结果表明：影响束流寿命的主要因素是与内靶分子（原子）之间的电荷交换及与冷却电子束之间的辐射复合；对于重离子束 ¹³²Xe⁵⁴⁺和 ²³⁸U⁹²⁺，与冷却电子束之间的辐射复合是影响其储存寿命的主要因素。The loss mechanism and lifetime of ion beams in collisions with residual gas, internal target and electrons in ecooler in heavy ion cooler storage rings were studied. The partial beam lifetimes resulting from various loss mechanisms and the total beam lifetimes of 50—500 MeV/u¹²C⁶⁺, ³⁶Ar¹⁸⁺, ¹³²Xe⁵⁴⁺ and ²³⁸U⁹²⁺ stored in the experimental ring of the Cooler Storage Ring at the Heavy Ion Research Facility in Lanzhou (HIRFLCSR) were calculated. The calculations indicate that the charge exchange process between ion beams and the internal target, as well as the radiative recombination process with the electrons in ecooler restrict the beam lifetime considerably. For heavy ion beams such as ¹³²Xe⁵⁴⁺ and ²³⁸U⁹²⁺, the radiative recombination is the dominant loss mechanism

Abstract: The loss mechanism and lifetime of ion beams in collisions with residual gas, internal target and electrons in ecooler in heavy ion cooler storage rings were studied. The partial beam lifetimes resulting from various loss mechanisms and the total beam lifetimes of 50—500 MeV/u¹²C⁶⁺, ³⁶Ar¹⁸⁺, ¹³²Xe⁵⁴⁺ and ²³⁸U⁹²⁺ stored in the experimental ring of the Cooler Storage Ring at the Heavy Ion Research Facility in Lanzhou (HIRFLCSR) were calculated. The calculations indicate that the charge exchange process between ion beams and the internal target, as well as the radiative recombination process with the electrons in ecooler restrict the beam lifetime considerably. For heavy ion beams such as ¹³²Xe⁵⁴⁺ and ²³⁸U⁹²⁺, the radiative recombination is the dominant loss mechanism

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