GeV能量的Fe离子在C<SUB>60</SUB>薄膜中的辐照效应研究

GeV能量的Fe离子在C₆₀薄膜中的辐照效应研究

摘要: 利用傅立叶转换红外光谱和Raman谱仪分析了0.98 GeV的Fe离子在电子能损Se为3.5 keV/nm时，不同辐照剂量（5×1010 —8×1013 ions/cm2)下，在C60薄膜中引起的辐照损伤效应。分析表明， Fe离子辐照引起了C60分子的聚合与损伤。在辐照剂量达到一中间值1×1012 ions/cm2， C60分子的损伤得到部分恢复，归因于电子激发引起的退火效应。通过对Raman数据的拟合分析，演绎出Fe离子辐照在C60材料中形成的潜径迹截面或引起损伤的截面约为1.32×10-14 cm2。

Abstract: The irradiation effects of C60 films induced by 0.98 GeV Fe ions at the same electronic energy loss of 3.5 keV/nm and different irradiation dose ranging from 5×1010 to 8×1013 ions/cm2 ， were analyzed by Raman scattering and Fourier transform infrared (FTIR) spectroscopes. The analysis results indicate that the irradiation results in a molecular polymerization and destruction of the C60. The partial recovery of the damage at the intermediate value of irradiation dose， 1×1012 ions/cm2， was caused by an annealing effect of electronic energy loss. The ion track or damage crosssection σ deduced from the Raman data was 1.32×10-14 cm2.