X射线质量衰减截面和光电截面的高精度测量

Measurement of Mass Attenuation and Photoelectric Cross Sections of Elements with High Accuracy in X ray Energy Range

摘要: 利用特征Ｘ射线源系统地测量了Ｓｉ、Ｆｅ、Ｃｕ、Ｙ、Ｉｎ、Ｓｎ等六种元素及ＳｉＨ４的Ｘ射线质量衰减系数，实验误差为±１％． By using the characteristic X ray sources and the Si( Li) detector system, the X ray mass attenuation coefficients for Si,Fe,Cu,Y,In,Sn and SiH 4 have been systematically measured in the energy range of 1.486～29.109 keV. The accuracy of experimental data has been reduced to ±1% .

Abstract: By using the characteristic X ray sources and the Si( Li) detector system, the X ray mass attenuation coefficients for Si,Fe,Cu,Y,In,Sn and SiH 4 have been systematically measured in the energy range of 1.486～29.109 keV. The accuracy of experimental data has been reduced to ±1% .