宇航器件中的单粒子效应及其加速器地面模拟

Heavy Ion Induced Single Event Upset and Its Accelerator Simulation Investigation

摘要: 描述了宇航半导体器件的单粒子效应的危害和研究方法，并介绍了用重离于加速器进行地面模拟研究的概况．The harm and investigation means of single event upset in spacecraft electronics are described and a survey of simulation test by using heavy ion accelerator is also given in this paper.

Abstract: The harm and investigation means of single event upset in spacecraft electronics are described and a survey of simulation test by using heavy ion accelerator is also given in this paper.