XIE Hongming, WU Junxia, MAO Lijun, YE Minyou, ZHANG Yong, ZHU Guangyu, MA Xiaoming, XUE Zongheng, JING Long, WEI Yuan, DU Ze. A Residual Gas Ionization Profile Monitor Developed for HIRFL-CSR[J]. Nuclear Physics Review, 2017, 34(4): 773-778. doi: 10.11804/NuclPhysRev.34.04.773
| Citation:
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XIE Hongming, WU Junxia, MAO Lijun, YE Minyou, ZHANG Yong, ZHU Guangyu, MA Xiaoming, XUE Zongheng, JING Long, WEI Yuan, DU Ze. A Residual Gas Ionization Profile Monitor Developed for HIRFL-CSR[J]. Nuclear Physics Review, 2017, 34(4): 773-778. doi: 10.11804/NuclPhysRev.34.04.773
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A Residual Gas Ionization Profile Monitor Developed for HIRFL-CSR
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XIE Hongming1,2
,
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WU Junxia2
,
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MAO Lijun2
,
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YE Minyou1
,
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ZHANG Yong2
,
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ZHU Guangyu2
,
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MA Xiaoming2
,
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XUE Zongheng2
,
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JING Long2
,
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WEI Yuan2
,
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DU Ze2
- 1.
School of Nuclear Science and Technology, University of Science and Technology of China, Hefei 230022, China;
- 2.
Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000, China
Funds:
National Natural Science Foundation of China(11405240)
- Received Date: 2017-03-01
- Rev Recd Date:
2017-04-07
- Publish Date:
2017-12-20
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Abstract
A new non-intercepting beam profile monitor, residual gas Ionization Profile Monitor (IPM), has been developed and tested at the main Cooling Storage Ring of Heavy Ion Research Facility in Lanzhou (HIRFL-CSRm). It has been successfully used for studies of electron cooling mechanisms, as well as profile monitoring under normal-mode operation in HIRFL-CSRm. The IPM measures the distribution of ions resulting from the residual gas ionization during the beam passage. The gas ions are collected and multiplied by tandem-type MCPs and a phosphor screen, and eventually captured by a commercial CCD camera outside the vacuum chamber. Before formally applied in HIRFL-CSRm, the IPM was tested and compared with a conventional wire scanner profile monitor at Sector Separated Cyclotron Linac (SSC Linac). Both results show good agreement. Besides, the IPM has higher signal to noise ratio than the wire scanner. It also has a very high spatial resolution of around 60 μm. This monitor can be used for low vacuum like Linac with resistance for bias voltage, or for ultra-high vacuum with discrete electrodes for bias voltage where the bakeout process is essential. Furthermore, a novel and compact design of one IPM with capability of detecting both horizontal and vertical profile is proposed. This compact IPM is quite suitable for non-invasive profile diagnostics at space shortage and high-current Linac.
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