Application of Monte Carlo Simulations in Measurement of Atomic Inner-shell Ionization Cross-sections by Low-energy Electron Impact
doi: 10.11804/NuclPhysRev.23.01.062
- Received Date: 1900-01-01
- Rev Recd Date: 1900-01-01
- Publish Date: 2006-03-20
Abstract: The sensitivity of the correction factor, which describes the combined effect of finite film thickness and the thick substrate in the measurement of atomic inner-shell ionization cross-sections by low-energy electron impact, to the adopted ionization cross-sections in the Monte Carlo simulation is discussed. Moreover, the electron escape ratio from the Faraday cup in our experiment is also obtained by Monte Carlo method.
Citation: | WU Ying, AN Zhu. Application of Monte Carlo Simulations in Measurement of Atomic Inner-shell Ionization Cross-sections by Low-energy Electron Impact[J]. Nuclear Physics Review, 2006, 23(1): 62-65. doi: 10.11804/NuclPhysRev.23.01.062 |