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Article Navigation >  Nuclear Physics Review  > 2004  >  21(3): 249-252

ZHOU Ping, LU Xiu-qin, GUO Ji-yu, ZHAO Kui, WU Wei-ming, SUI Li, NI Mei-nan, MEI Jun-ping, LUO Hong-bing, LIU Jian-cheng. Elastic Recoil Detection Analysis of α-Si_(1-x)C_x∶H Thin Films[J]. Nuclear Physics Review, 2004, 21(3): 249-252. doi: 10.11804/NuclPhysRev.21.03.249
Citation: ZHOU Ping, LU Xiu-qin, GUO Ji-yu, ZHAO Kui, WU Wei-ming, SUI Li, NI Mei-nan, MEI Jun-ping, LUO Hong-bing, LIU Jian-cheng. Elastic Recoil Detection Analysis of α-Si_(1-x)C_x∶H Thin Films[J]. Nuclear Physics Review, 2004, 21(3): 249-252. doi: 10.11804/NuclPhysRev.21.03.249
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Elastic Recoil Detection Analysis of α-Si_(1-x)C_x∶H Thin Films

doi: 10.11804/NuclPhysRev.21.03.249

  • (1 China Institute of Atomic Energy; Beijing 102413; China;2 Department of Physics; Guangxi University; Nanning 530004; Guangxi; China);

  • Received Date: 1900-01-01
  • Rev Recd Date: 1900-01-01
  • Publish Date: 2004-09-20
  • Elastic recoil detection analysis of α-Si_(1-x)C_(x)∶H foils has been performed at the HI-13 tandem accelerator of CIAE. High quality~(127)I beam bombards the target of α -Si_(1-x)C_(x)∶H_( ) thin film. A ΔE(gas)-(E(PSD)) telescope was used to measure the energy spectra of all elements recoiled from the samples at the angle of 30° in laboratory system. Components of H, C and Si and the profiles were obtained by simulation of the energy spectra using the program SIMNRA calculation.
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Elastic Recoil Detection Analysis of α-Si_(1-x)C_x∶H Thin Films

doi: 10.11804/NuclPhysRev.21.03.249
  • (1 China Institute of Atomic Energy; Beijing 102413; China;2 Department of Physics; Guangxi University; Nanning 530004; Guangxi; China);
  • Received Date: 1900-01-01
  • Rev Recd Date: 1900-01-01
  • Publish Date: 2004-09-20

Abstract: Elastic recoil detection analysis of α-Si_(1-x)C_(x)∶H foils has been performed at the HI-13 tandem accelerator of CIAE. High quality~(127)I beam bombards the target of α -Si_(1-x)C_(x)∶H_( ) thin film. A ΔE(gas)-(E(PSD)) telescope was used to measure the energy spectra of all elements recoiled from the samples at the angle of 30° in laboratory system. Components of H, C and Si and the profiles were obtained by simulation of the energy spectra using the program SIMNRA calculation.

ZHOU Ping, LU Xiu-qin, GUO Ji-yu, ZHAO Kui, WU Wei-ming, SUI Li, NI Mei-nan, MEI Jun-ping, LUO Hong-bing, LIU Jian-cheng. Elastic Recoil Detection Analysis of α-Si_(1-x)C_x∶H Thin Films[J]. Nuclear Physics Review, 2004, 21(3): 249-252. doi: 10.11804/NuclPhysRev.21.03.249
Citation: ZHOU Ping, LU Xiu-qin, GUO Ji-yu, ZHAO Kui, WU Wei-ming, SUI Li, NI Mei-nan, MEI Jun-ping, LUO Hong-bing, LIU Jian-cheng. Elastic Recoil Detection Analysis of α-Si_(1-x)C_x∶H Thin Films[J]. Nuclear Physics Review, 2004, 21(3): 249-252. doi: 10.11804/NuclPhysRev.21.03.249
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