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LIU Chang-long. He Ion Implantation Induced Bubbles in Silicon and Their Potential Applications[J]. Nuclear Physics Review, 2004, 21(3): 231-237. doi: 10.11804/NuclPhysRev.21.03.231
Citation: LIU Chang-long. He Ion Implantation Induced Bubbles in Silicon and Their Potential Applications[J]. Nuclear Physics Review, 2004, 21(3): 231-237. doi: 10.11804/NuclPhysRev.21.03.231

He Ion Implantation Induced Bubbles in Silicon and Their Potential Applications

doi: 10.11804/NuclPhysRev.21.03.231
  • Received Date: 1900-01-01
  • Rev Recd Date: 1900-01-01
  • Publish Date: 2004-09-20
  • He ion implantation induced bubbles or cavities in silicon have been paid more and more attentions due to their potential applications in modern semiconductor technology. In this paper, He ion implantation induced formation and growth of bubbles in silicon together with their interactions with other defects were first briefly reviewed. Then the possible growth mechanisms of He bubbles in silicon and their potential applications in modern semiconductor technology were described. Finally, we presented the ke...
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He Ion Implantation Induced Bubbles in Silicon and Their Potential Applications

doi: 10.11804/NuclPhysRev.21.03.231

Abstract: He ion implantation induced bubbles or cavities in silicon have been paid more and more attentions due to their potential applications in modern semiconductor technology. In this paper, He ion implantation induced formation and growth of bubbles in silicon together with their interactions with other defects were first briefly reviewed. Then the possible growth mechanisms of He bubbles in silicon and their potential applications in modern semiconductor technology were described. Finally, we presented the ke...

LIU Chang-long. He Ion Implantation Induced Bubbles in Silicon and Their Potential Applications[J]. Nuclear Physics Review, 2004, 21(3): 231-237. doi: 10.11804/NuclPhysRev.21.03.231
Citation: LIU Chang-long. He Ion Implantation Induced Bubbles in Silicon and Their Potential Applications[J]. Nuclear Physics Review, 2004, 21(3): 231-237. doi: 10.11804/NuclPhysRev.21.03.231

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