Heavy Ion Induced Single Event Upset and Its Accelerator Simulation Investigation

Hou Ming-dong; Ma Feng; Liu Jie

doi:10.11804/NuclPhysRev.13.01.032

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Article Navigation > Nuclear Physics Review > 1996 > 13(1): 32-35

Hou Ming-dong, Ma Feng, Liu Jie. Heavy Ion Induced Single Event Upset and Its Accelerator Simulation Investigation[J]. Nuclear Physics Review, 1996, 13(1): 32-35. doi: 10.11804/NuclPhysRev.13.01.032

Citation:

Hou Ming-dong, Ma Feng, Liu Jie. Heavy Ion Induced Single Event Upset and Its Accelerator Simulation Investigation[J]. Nuclear Physics Review, 1996, 13(1): 32-35. doi: 10.11804/NuclPhysRev.13.01.032

Heavy Ion Induced Single Event Upset and Its Accelerator Simulation Investigation

doi: 10.11804/NuclPhysRev.13.01.032

(Institute of Modern Physics; Chinese Academy of Sciences; Lanzhou 730000);

Received Date: 1900-01-01
Rev Recd Date: 1900-01-01
Publish Date: 1996-03-20

Abstract

The harm and investigation means of single event upset in spacecraft electronics are described and a survey of simulation test by using heavy ion accelerator is also given in this paper.
- single event upset,
- semiconductor device,
- heavy ion application
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