关键词: 
HIRFLCSR实验环 /
离子束 /
束流寿命

摘要: 分析了在储存环中回旋的离子束与残余气体分子、 内靶和冷却电子束相互作用时的损失机制及相应的束流寿命， 针对兰州重离子加速器冷却储存环实验环内靶模式， 计算了50—500 MeV/u ¹²C⁶⁺, ³⁶Ar¹⁸⁺, ¹³²Xe⁵⁴⁺和 ²³⁸U⁹²⁺等束流在各种损失机制影响下所对应的束流寿命和总的束流寿命。 结果表明： 影响束流寿命的主要因素是与内靶分子（原子）之间的电荷交换及与冷却电子束之间的辐射复合； 对于重离子束 ¹³²Xe⁵⁴⁺和 ²³⁸U⁹²⁺， 与冷却电子束之间的辐射复合是影响其储存寿命的主要因素。The loss mechanism and lifetime of ion beams in collisions with residual gas, internal target and electrons in ecooler in heavy ion cooler storage rings were studied. The partial beam lifetimes resulting from various loss mechanisms and the total beam lifetimes of 50—500 MeV/u¹²C⁶⁺, ³⁶Ar¹⁸⁺, ¹³²Xe⁵⁴⁺ and ²³⁸U⁹²⁺ stored in the experimental ring of the Cooler Storage Ring at the Heavy Ion Research Facility in Lanzhou (HIRFLCSR) were calculated. The calculations indicate that the charge exchange process between ion beams and the internal target, as well as the radiative recombination process with the electrons in ecooler restrict the beam lifetime considerably. For heavy ion beams such as ¹³²Xe⁵⁴⁺ and ²³⁸U⁹²⁺, the radiative recombination is the dominant loss mechanism