Irradition Effect in C60 Films Induced by GeV Fe Ions
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摘要: 利用傅立叶转换红外光谱和Raman谱仪分析了0.98 GeV的Fe离子在电子能损Se为3.5 keV/nm时, 不同辐照剂量(5×1010 —8×1013 ions/cm2)下, 在C60薄膜中引起的辐照损伤效应。 分析表明, Fe离子辐照引起了C60分子的聚合与损伤。 在辐照剂量达到一中间值1×1012 ions/cm2, C60分子的损伤得到部分恢复, 归因于电子激发引起的退火效应。 通过对Raman数据的拟合分析, 演绎出Fe离子辐照在C60材料中形成的潜径迹截面或引起损伤的截面约为1.32×10-14 cm2。Abstract: The irradiation effects of C60 films induced by 0.98 GeV Fe ions at the same electronic energy loss of 3.5 keV/nm and different irradiation dose ranging from 5×1010 to 8×1013 ions/cm2 , were analyzed by Raman scattering and Fourier transform infrared (FTIR) spectroscopes. The analysis results indicate that the irradiation results in a molecular polymerization and destruction of the C60. The partial recovery of the damage at the intermediate value of irradiation dose, 1×1012 ions/cm2, was caused by an annealing effect of electronic energy loss. The ion track or damage crosssection σ deduced from the Raman data was 1.32×10-14 cm2.
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Key words:
- C60 film /
- irradiation effect /
- GeV energy ion /
- annealing effect /
- polymerization
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