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离子辐照单晶Si损伤效应的研究

刘昌龙 朱智勇 侯明东 金运范 王志光

刘昌龙, 朱智勇, 侯明东, 金运范, 王志光. 离子辐照单晶Si损伤效应的研究[J]. 原子核物理评论, 2000, 17(3): 140-145. doi: 10.11804/NuclPhysRev.17.03.140
引用本文: 刘昌龙, 朱智勇, 侯明东, 金运范, 王志光. 离子辐照单晶Si损伤效应的研究[J]. 原子核物理评论, 2000, 17(3): 140-145. doi: 10.11804/NuclPhysRev.17.03.140
LIU Chang-long, ZHU Zhi-yong, HOU Ming-dong, JIN Yun-fan, WANG Zhi-guang. Radiation Damage in Silicon Induced by Ion Irradiation[J]. Nuclear Physics Review, 2000, 17(3): 140-145. doi: 10.11804/NuclPhysRev.17.03.140
Citation: LIU Chang-long, ZHU Zhi-yong, HOU Ming-dong, JIN Yun-fan, WANG Zhi-guang. Radiation Damage in Silicon Induced by Ion Irradiation[J]. Nuclear Physics Review, 2000, 17(3): 140-145. doi: 10.11804/NuclPhysRev.17.03.140

离子辐照单晶Si损伤效应的研究

doi: 10.11804/NuclPhysRev.17.03.140

Radiation Damage in Silicon Induced by Ion Irradiation

  • 摘要: 回顾了低能离子注入单晶Si经由核弹性碰撞引起的损伤特征及其常规的研究方法,介绍了快重离子辐照单晶Si经由电子能损引起的损伤特点及研究现状,并对该领域的研究作了展望. The radiation damage in silicon induced by low energy ion implantation was briefly reviewed together with a short introduction to the common techniques in the area. The damage characteristics of swift heavy ion irradiation in silicon and its investigations were introduced with emphasis on the effects induced by processes of electronic energy losses. It is shown that swift heavy ion can induce defects far beyond the projected range and up to 28 MeV/μm the electronic energy ...
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出版历程
  • 收稿日期:  1900-01-01
  • 修回日期:  1900-01-01
  • 刊出日期:  2000-09-20

离子辐照单晶Si损伤效应的研究

doi: 10.11804/NuclPhysRev.17.03.140

摘要: 回顾了低能离子注入单晶Si经由核弹性碰撞引起的损伤特征及其常规的研究方法,介绍了快重离子辐照单晶Si经由电子能损引起的损伤特点及研究现状,并对该领域的研究作了展望. The radiation damage in silicon induced by low energy ion implantation was briefly reviewed together with a short introduction to the common techniques in the area. The damage characteristics of swift heavy ion irradiation in silicon and its investigations were introduced with emphasis on the effects induced by processes of electronic energy losses. It is shown that swift heavy ion can induce defects far beyond the projected range and up to 28 MeV/μm the electronic energy ...

English Abstract

刘昌龙, 朱智勇, 侯明东, 金运范, 王志光. 离子辐照单晶Si损伤效应的研究[J]. 原子核物理评论, 2000, 17(3): 140-145. doi: 10.11804/NuclPhysRev.17.03.140
引用本文: 刘昌龙, 朱智勇, 侯明东, 金运范, 王志光. 离子辐照单晶Si损伤效应的研究[J]. 原子核物理评论, 2000, 17(3): 140-145. doi: 10.11804/NuclPhysRev.17.03.140
LIU Chang-long, ZHU Zhi-yong, HOU Ming-dong, JIN Yun-fan, WANG Zhi-guang. Radiation Damage in Silicon Induced by Ion Irradiation[J]. Nuclear Physics Review, 2000, 17(3): 140-145. doi: 10.11804/NuclPhysRev.17.03.140
Citation: LIU Chang-long, ZHU Zhi-yong, HOU Ming-dong, JIN Yun-fan, WANG Zhi-guang. Radiation Damage in Silicon Induced by Ion Irradiation[J]. Nuclear Physics Review, 2000, 17(3): 140-145. doi: 10.11804/NuclPhysRev.17.03.140

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