[1] TAKAHASHI K, KUZUMOTO M, MATSUMOTO Y, et al. Review of Scientific Instruments, 2020, 91: 033310. doi:  10.1063/1.5128633
[2] OKAMURA M, SEKINE M, IKEDA S, et al. Laser and Particle Beams, 2015, 33: 137. doi:  10.1017/S026303461500004X
[3] SEKINE M, IKEDA S, ROMANELLI M, et al. Nucl Instr and Meth A, 2015, 795: 151. doi:  10.1016/j.nima.2015.05.030
[4] PEACOCK N J, PEASE R S. Journal of Physics D: Applied Physics, 1969, 2: 1705. doi:  10.1088/0022-3727/2/12/311
[5] GAMMINO S, TORRISI L, CAVALLARO S, et al. Review of Scientific Instruments, 2010, 81: 02A508. doi:  10.1063/1.3267291
[6] YEATES P, COSTELLO J T, KENNEDY E T. Review of Scientific Instruments, 2010, 81: 043305. doi:  10.1063/1.3374123
[7] GASIOR P.Can ICAN can CERN into a can: Review Study[C]//Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2013, October 23, 2013, Wilga, Poland. Bellingham: SPIE, 2013: 89030N.
[8] IKEDA S, KUMAKI M, KANESUE T, et al. Review of Scientific Instruments, 2016, 87: 02A915. doi:  10.1063/1.4935785
[9] SAKO T, YAMAGUCHI A, SATO K, et al. Review of Scientific Instruments, 2016, 87: 02C109. doi:  10.1063/1.4935975
[10] ALNAIMI R. Time of Flight in Electrostatic Ion Analyser for Laser Produced Plasma ion Resolving[C]//Proc SPIE 11032, EUV and X-ray Optics: Synergy between Laboratory and Space VI, April 26, 2019, Prague, Czech Republic. Bellingham: SPIE, 2019: 11032K.
[11] ALNAIMI R. Journal of Instrumentation, 2017, 12: 6001. doi:  10.1088/1748-0221/12/06/P06001
[12] ROSINSKI M, BADZIAK J, BOODY F P, et al. Vacuum, 2005, 78: 435. doi:  10.1016/j.vacuum.2005.01.064
[13] BALABAEV A, KONDRASHEV S, KONUKOV K, et al. Review of Scientific Instruments, 2004, 75: 1572. doi:  10.1063/1.1691512
[14] ZHAO Huanyu, ZHANG Junjie, JIN Qianyu, et al. Review of Scientific Instruments, 2016, 87: 02A917. doi:  10.1063/1.4937115
[15] FOURNIER P, GREGOIRE G, KUGLER H, et al. Review of Scientific Instruments, 2000, 71: 924. doi:  10.1063/1.1150347
[16] KONDRASHEV S, MESCHERYAKOV N, SHARKOV B, et al. Review of Scientific Instruments, 2000, 71: 1409. doi:  10.1063/1.1150471
[17] OKAMURA M, ADEYEMI A, KANESUE T, et al. Review of Scientific Instruments, 2010, 81: 02A510. doi:  10.1063/1.3267312
[18] WANG Guicai, ZHAO Huanyu, JIN Qianyu, et al. Review of Scientific Instruments, 2019, 90: 113302. doi:  10.1063/1.5128637
[19] BROWN I G, The Physics and Technology of Ion Sources [M]. Weinheim : Wiley-VCH Verlag GmbH & Co KGaA, 2004.
[20] BADZIAK J, PARYS P, VANKOV A B, et al. Applied Physics Letters, 2001, 79: 21. doi:  10.1063/1.1381570