[1] |
RAJSUMAN R. IEEE Design & Test of Computers, 2001, 18(3):16. |
[2] |
MING Z, YI X L, CHANG L, et al. IEEE Transactions on Nuclear Science, 2011, 25(1):289. |
[3] |
WROBEL F, PALAU J M, CALVET M C, et al. IEEE Transactions on Nuclear Science, 2001, 48(6):1946. |
[4] |
RUCKERBAUER F X. Georgakos G. Soft Error Rates in 65 nm SRAMs-Analysis of new Phenomena[C]//13th IEEE International On-Line Testing Symposium, IOLTS 2007, IEEE International, 2007:203. |
[5] |
SEIFERT N, SLANKARD P, KIRSCH M, et al. Radiation Induced Soft Error Rates of Advanced CMOS Bulk Devices[M]. New York:IEEE, 2006:217. |
[6] |
GASIOT G, GIOT D, ROCHE P. IEEE Transactions on Nuclear Science, 2007, 54(6):2468. |
[7] |
TIPTON A D, PELLISH J A, REED R A, et al. IEEE Transactions on Nuclear Science, 2006, 53(6):3259. |
[8] |
GASIOT G, ROCHE P, FLATRESSE P. Comparison of Multiple Cell Upset Response of BULK and SOI 130 nm Technologies in the Terrestrial Environment[C]//IEEE International Reliability Physics Symposium, IRPS 2008, IEEE International,2008:192. |
[9] |
HEIDEL D F, RODBELL K P, OLDIGES P, et al. IEEE Transactions on Nuclear Science, 2006, 53(6):3512. |
[10] |
BAEG S, WEN S, WONG R. IEEE Transactions on Nuclear Science, 2009, 56(4):2111. |
[11] |
RADAELLI D, PUCHNER H, SKIP W, et al. IEEE Transactions on Nuclear Science, 2005, 52(6):2433. |
[12] |
TONG T, WANG X H, ZHANG Z G, et al. Nuclear Science and Techniques, 2014, 25(1):010404-1. |
[13] |
WIRTHLIN M, LEE D, SWIFT G, et al. IEEE Transactions on Nuclear Science, 2014, 61(6):3080. |
[14] |
ZIEGLER J F, ZIEGLER M D, BIERSACK J P. Nucl Instr Meth B, 2010, 268(11-12):1818. |
[15] |
ZIEGLER J F, ZIEGLER M D, BIERSACK J P. SRIM-2013[EB/OL]. http://www.srim.org/SRIM/SRIMLEGL.htm. |
[16] |
ZHANG Zhangang. Study on Accelerator-based Testing of Single Event Effects in Static Random Access Memories[D]. Lanzhou:Institute of Modern Physics, CAS, 2013:28. (in Chinese) (张战刚. SRAM单粒子效应地面加速器模拟试验研究[D]. 兰州:中国科学院近代物理研究所, 2013:28.) |
[17] |
GIOT D, ROCHE P, GASIOT G, et al. IEEE Transactions on Nuclear Science, 2008, 55(4):2048. |
[18] |
BORUZDINA A B, SOGOYAN A V, SMOLIN A A, et al. IEEE Transactions on Nuclear Science, 2015, 62(6):2860. |
[19] |
GENG C, LIU J, XI K, et al. Chinese Physics B, 2013, 22(5):059501-1. |